CMOS SRAM circuit design and parametric test in nano-scaled technologies : process - aware SRAM design and test

By:

Contributor(s):

Material type: Text

TextSeries: Frontiers in electronic testingPublication details: New Delhi; Springer; 2008Description: xvi, 193pISBN:

Subject(s):

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Holdings
Item type	Home library	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	621.38.049CMOSP80 (Browse shelf(Opens below))	Not for loan	51751

Includes bibliographical references and index

There are no comments on this title.

to post a comment.

Central Library - Coimbatore