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ISTFA 2010 Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA

ASM International.-Electronic Device Failure Analysis Society.

ISTFA 2010 Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA - ASM International 2010

ISBN: 9781615030415

Subjects--Topical Terms:
Mechanical
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.
TECHNOLOGY & ENGINEERING

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ISTFA 2010 Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA