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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA

Electronic Device Failure Analysis Society.-ASM International.

ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA - ASM International 2007

ISBN: 9780871708632

Subjects--Topical Terms:
Circuits
Electronics
General
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.
TECHNOLOGY & ENGINEERING

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ISTFA 2007 Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA