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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California

Electronic Device Failure Analysis Society.-ASM International.

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California - ASM International 2005

ISBN: 9780871708236

Subjects--Topical Terms:
Circuits
Electronics
General
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.
TECHNOLOGY & ENGINEERING

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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California