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ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California

Electronic Device Failure Analysis Society.-ASM International.

ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California - ASM International 2001

ISBN: 9780871707468

Subjects--Topical Terms:
Circuits
Electronics
General
Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.
TECHNOLOGY & ENGINEERING

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ISTFA 2001 Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California