System-on-Chip Test Architectures Nanometer Design for Testability
Laung-Terng Wang-Charles E. Stroud-Nur A. Touba
System-on-Chip Test Architectures Nanometer Design for Testability - Morgan Kaufmann 2008 - The Morgan Kaufmann Series in Systems on Silicon .
9780123739735
Industrial Design
Product
Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing.
TECHNOLOGY & ENGINEERING
System-on-Chip Test Architectures Nanometer Design for Testability - Morgan Kaufmann 2008 - The Morgan Kaufmann Series in Systems on Silicon .
9780123739735
Industrial Design
Product
Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing.
TECHNOLOGY & ENGINEERING