VLSI Test Principles and Architectures Design for Testability
Laung-Terng Wang-Cheng-Wen Wu-Xiaoqing Wen
VLSI Test Principles and Architectures Design for Testability - Morgan Kaufmann 2006 - The Morgan Kaufmann Series in Systems on Silicon .
9780123705976
Industrial Design
Product
Integrated circuits--Very large scale integration--Design and construction.,Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.
TECHNOLOGY & ENGINEERING
VLSI Test Principles and Architectures Design for Testability - Morgan Kaufmann 2006 - The Morgan Kaufmann Series in Systems on Silicon .
9780123705976
Industrial Design
Product
Integrated circuits--Very large scale integration--Design and construction.,Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.
TECHNOLOGY & ENGINEERING