Built-in test for VLSI pseudorandom techniques
Bardell, Paul H
Built-in test for VLSI pseudorandom techniques - New York John Wiley 1987 - xiii, 354p. ;
Includes index
471624632
Integrated circuits -- Very large scale integration(VLSI) -- Testing
Built-in test for VLSI pseudorandom techniques - New York John Wiley 1987 - xiii, 354p. ;
Includes index
471624632
Integrated circuits -- Very large scale integration(VLSI) -- Testing