Central Library - Coimbatore

Online Public Access Catalog

Built-in test for VLSI pseudorandom techniques

Bardell, Paul H

Built-in test for VLSI pseudorandom techniques - New York John Wiley 1987 - xiii, 354p. ;

Includes index

471624632


Integrated circuits -- Very large scale integration(VLSI) -- Testing

Maintained by : Central Library, Amrita Vishwa Vidyapeetham, Coimbatore

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