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Defect-oriented testing for nano-metric CMOS VLSI circuits

Sachdev, Manoj

Defect-oriented testing for nano-metric CMOS VLSI circuits - 2 - New Delhi Springer 2007 - xxi, 328p - Frontiers electronic testing .

Reprint year 2010. Includes index

ISBN: 9788184894295

Subjects--Topical Terms:
CMOS Technology
Digital CMOS Fault modeling
Nano-metric CMOS VLSI circuits Defect-oriented testing

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Defect-oriented testing for nano-metric CMOS VLSI circuits