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Next generation wireless LANs : throughput, robustness, and reliability in 802.11n

Perahia, Eldad

Next generation wireless LANs : throughput, robustness, and reliability in 802.11n - Cambridge University Press New Delhi 2008 - xxx, 385p.

Includes bibliographical references and index.

ISBN: 9780521758338

Subjects--Topical Terms:
Channel access techniques
IEEE 802.1 n technology
Medium access control(MAC)
MIMO Systems
OFDM Devices
Transmit beamforming -- SVD
Wireless communication
Wireless LANs

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Next generation wireless LANs : throughput, robustness, and reliability in 802.11n