Principles of semiconductor network testing (Record no. 22769)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00547nam a2200205Ia 4500 |
| 001 - CONTROL NUMBER | |
| control field | 6647 |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20250221145819.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 250214s9999||||xx |||||||||||||| ||und|| |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 750694726 |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Afshar, Amir |
| 245 #0 - TITLE STATEMENT | |
| Title | Principles of semiconductor network testing |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | Boston |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Name of publisher, distributor, etc. | Butterworth-Heinemann |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Date of publication, distribution, etc. | 1995 |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 213p. ; |
| 500 ## - GENERAL NOTE | |
| General note | Includes bibliographical references and index. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Integrated circuits -- Tedting |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Semiconductors -- Testing |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | BOOKS |
| Date last seen | Total checkouts | Full call number | Barcode | Price effective from | Koha item type | Lost status | Damaged status | Not for loan | Collection | Withdrawn status | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 21.02.2025 | 621.382 N57 | 6647 | 21.02.2025 | BOOKS | Not for loan | REFERENCE | AMRITA SCHOOL OF ENGINEERING | AMRITA SCHOOL OF ENGINEERING | RF53-R4 | 21.02.2025 | 3015.00 |