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Proceedings : 13th IEEE VLSI test symposium, April 30 - May 3, 1995, Princeton, New Jersey

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Material type: Text

TextPublication details: California; IEEE Computer scoiety press; 1995Description: xix, 493pISBN:

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Item type	Home library	Collection	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	REFERENCE	621.38.049.2 N52 (Browse shelf(Opens below))	Not for loan	11314

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Sponsored by IEEE computer society technical committee on test technology, IEEE Philadelphia section

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