Fault tolerance and reliability techniques for high-density random-access memories

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Material type: Text

TextPublication details: Delhi; Pearson Education; 2002Description: xix, 426pISBN:

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Item type	Home library	Call number	Status	Barcode
BOOKS	AMRITA SCHOOL OF ENGINEERING	621.38.049 P28 (Browse shelf(Opens below))	Available	24432

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Previous	621.38.049 P22;2 CMOS analog circuit design	621.38.049 P22;3 CMOS analog circuit design	621.38.049 P22;4 CMOS analog circuit design	621.38.049 P28 Fault tolerance and reliability techniques for high-density random-access memories	621.38.049 P29 Design for electrical and computer engineers	621.38.049 P291 Modern IC data and substitution manual	621.38.049 P291;P6 modern IC data and substitution manual	Next

Includes bibliographical references and index

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