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VLSI test principles and architectures : design for testability
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TextPublication details: San Francisco, CA; Morgan Kauffman; 2006Description: xxx,777p. : ill. ;Rs: 7196.00ISBN: - 9780123705976
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AMRITA SCHOOL OF ENGINEERING | REFERENCE | 621.38.049.2 P60 (Browse shelf(Opens below)) | Not for loan | 69440 | |
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BOOKS
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AMRITA SCHOOL OF ENGINEERING | REFERENCE | 621.38.049.2 P60 (Browse shelf(Opens below)) | Not for loan | 69441 |
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| 621.38.049.2 P30 Analog VLSIdesign automation | 621.38.049.2 P41 Power distribution network design for VLSI | 621.38.049.2 P60 VLSI test principles and architectures : design for testability | 621.38.049.2 P60 VLSI test principles and architectures : design for testability | 621.38.049.2 P70 High-speed VLSI interconnections | 621.38.049.2 P71 Digital VLSI systems design : a design manual for implementation of projects on FPGAs and ASICs using verilog | 621.38.049.2Q00 Practical problems in VLSI physical design automation |
includes index
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