TY  - DATA
AU  - Cher Ming Tan
AU  -  Feifei He
TI  - Electromigration Modeling at Circuit Layout Level
T2  - springerBriefs in Applied sciences and Technology
SN  - 9789814451215
PB  - springer
KW  - Engineering
KW  - security science and Technology
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-4451-21-5
ER  -