Ran Wang <br/><br/>
Testing of Interposer Based 2.5D Integrated Circuits 

 - 1st ed. 2017 
 -  Springer  2017 
<br/><br/><label>ISBN: </label>9783319547145 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic Circuits and Systems<br/>Engineering