TY  - DATA
AU  - Ran Wang
TI  - Testing of Interposer Based 2.5D Integrated Circuits
SN  - 9783319547145
PB  - Springer
KW  - Electronic Circuits and Systems
KW  - Engineering
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-54714-5
ER  -