TY  - DATA
AU  - Jiann Shiun Yuan
TI  - CMOS RF Circuit Design for Reliability and Variability
T2  - SpringerBriefs in Applied Sciences and Technology
SN  - 9789811008849
PB  - Springer
KW  - Electronic Circuits and Systems
KW  - Engineering
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-10-0884-9
ER  -