TY  - DATA
AU  - Selahattin Sayil
AU  -  Toshio Nakagawa
TI  - Contactless VLSI Measurement and Testing Techniques
SN  - 9783319696737
PB  - Springer
KW  - Electronic Circuits and Systems
KW  - Engineering
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-69673-7
ER  -