TY  - DATA
AU  - Victor Champac
TI  - Timing Performance of Nanometer Digital Circuits Under Process Variations
T2  - Frontiers in Electronic Testing
SN  - 9783319754659
PB  - Springer
KW  - Electronic Circuits and Systems
KW  - Engineering
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-75465-9
ER  -