Ireneusz Mrozek <br/><br/>
Multi run Memory Tests for Pattern Sensitive Faults 

 - 1st ed  2019 
 -  springer  2019 
<br/><br/><label>ISBN: </label>9783319912042 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electronic Circuits and Systems<br/>Engineering