TY  - DATA
AU  - Ireneusz Mrozek
TI  - Multi run Memory Tests for Pattern Sensitive Faults
SN  - 9783319912042
PB  - springer
KW  - Electronic Circuits and Systems
KW  - Engineering
UR  - https://link.springer.com/openurl?genre=book&isbn=978-3-319-91204-2
ER  -