TY  - DATA
AU  - Xiaowei Li
AU  -  Cheng Liu
AU  -  Guihai Yan
TI  - Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design
SN  - 9789811985515
PB  - Springer
KW  - Computer Science
KW  - Hardware Performance and Reliability
UR  - https://link.springer.com/openurl?genre=book&isbn=978-981-19-8551-5
ER  -