Afshar, Amir <br/><br/>
Principles of semiconductor network testing 

 - Boston  Butterworth-Heinemann  1995 
 - 213p. ;  
<br/><br/> Includes bibliographical references and index. 
<br/><br/><label>ISBN: </label>750694726 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits -- Tedting<br/>Semiconductors -- Testing