ASM International.-Electronic Device Failure Analysis Society. <br/><br/>
ISTFA 2017  Conference Proceedings From the 43rd International Symposium for Testing and Failure Analysis: November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA 

 -  ASM  2017 
<br/><br/><label>ISBN: </label>9781627081504 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Mechanical<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING