Proceedings 12th IEEE VLSI test symposium, April 28-28, 1994, Cherry hill, New Jersey 

 - Washington  IEEE Computer society press  1994 
 - xviii, 466p. 
<br/><br/> Includes index 
<br/><br/><label>ISBN: </label>818654406 
<br/><br/><label>Subjects--Topical Terms: </label><br/>IEEE VLSI test symposium