Proceedings : 13th IEEE VLSI test symposium, April 30 - May 3, 1995, Princeton, New Jersey 

 - California  IEEE Computer scoiety press  1995 
 - xix, 493p. 
<br/><br/> Sponsored by IEEE computer society technical committee on test technology, IEEE Philadelphia section 
<br/><br/><label>ISBN: </label>818670002 
<br/><br/><label>Subjects--Topical Terms: </label><br/>IEEE computer society technical committee on test technology -- Symposium <br/>IEEE VLSI test symposium<br/>VLSI -- Symposium proceesings