Proceedings 14th IEEE VLSI test symposium, April 28 - May 1, 1996, Princeton, New Jersey 

 - California  IEEE Computer society press  1996 
 - xxix, 509p. 
<br/><br/><label>ISBN: </label>818673044 
<br/><br/><label>Subjects--Topical Terms: </label><br/>VLSI Test symposium (IEEE) -- Conference proceesings