TY  - BOOK
ED  - IEEE VLSI test symposium (14th : 1996 : New Jersey)
TI  - Proceedings 14th IEEE VLSI test symposium, April 28 - May 1, 1996, Princeton, New Jersey
SN  - 818673044
CY  - California
KW  - VLSI Test symposium (IEEE) -- Conference proceesings
ER  -