TY  - BOOK
AU  - Abramovici, Miron, ed.
AU  - Breuer, Melvin A, ed.
AU  - Friedman, Arthur D, ed.
TI  - Digital systems testing and testable design
SN  - 817224438X
CY  - Delhi
KW  - Bridging faults -- Testing
KW  - Digital systems -- Testing
KW  - Fault modeling and simulation
KW  - Logic-level diagnosis
KW  - Single stuck faults -- Testing
KW  - Testable design -- Digital systems
N1  - Includes bibliographical references and index
ER  -