TY  - DATA
AU  - Yong Ho Sohn-C. Campbell-D. Lewis-Afina Lupulescu
TI  - Diffusion in Advanced Materials and Processing
T2  - Diffusion and Defect Data. Pt. A, Defect and Diffusion Forum
SN  - 9783908451457
PB  - Trans Tech Publications Ltd
KW  -  General
KW  -  Materials Science
KW  - Diffusion--Congresses.,Kirkendall effect--Congresses.,Materials--Congresses
KW  - TECHNOLOGY & ENGINEERING
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=646269
ER  -