ASM International.-Electronic Device Failure Analysis Society. <br/><br/>
ISTFA 2010  Conference Proceedings From the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA 

 -  ASM International  2010 
<br/><br/><label>ISBN: </label>9781615030415 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Mechanical<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING