Electronic Device Failure Analysis Society.-ASM International. <br/><br/>
ISTFA 2007  Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA 

 -  ASM International  2007 
<br/><br/><label>ISBN: </label>9780871708632 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Circuits <br/> Electronics <br/> General<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING