Proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA - Electronic Device Failure Analysis Society.-ASM International (ASM International, 2007)
Keywords: Circuits; Electronics; General; Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.; TECHNOLOGY & ENGINEERING