Electronic Device Failure Analysis Society.-ASM International. <br/><br/>
ISTFA 2005  Proceedings of the 31st International Symposium for Testing and Failure Analysis, November 6-10, 2005, McEnery Convention Center, San Jose, California 

 -  ASM International  2005 
<br/><br/><label>ISBN: </label>9780871708236 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Circuits <br/> Electronics <br/> General<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING