ASM International.-Electronic Device Failure Analysis Society. <br/><br/>
ISTFA 2003  Proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California 

 -  ASM International  2003 
<br/><br/><label>ISBN: </label>9780871707888 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Digital<br/> Electronics <br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING