Electronic Device Failure Analysis Society.-ASM International. <br/><br/>
ISTFA 2001  Proceedings of the 27th International Symposium for Testing and Failure Analysis: 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California 

 -  ASM International  2001 
<br/><br/><label>ISBN: </label>9780871707468 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Circuits <br/> Electronics <br/> General<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING