ASM International <br/><br/>
ISTFA 1997: Proceedings of the 23rd International Symposium for Testing and Failure Analysis 

 -  ASM International  1997 
<br/><br/><label>ISBN: </label>9780871706195 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Circuits <br/> Electronics <br/> General<br/>Electronic apparatus and appliances--Testing--Congresses.,Electronics--Materials--Testing--Congresses.<br/>TECHNOLOGY & ENGINEERING