TY  - DATA
AU  - Laung-Terng Wang-Charles E. Stroud-Nur A. Touba
TI  - System-on-Chip Test Architectures
T2  - The Morgan Kaufmann Series in Systems on Silicon
SN  - 9780123739735
PB  - Morgan Kaufmann
KW  -  Industrial Design
KW  -  Product
KW  - Integrated circuits--Very large scale integration--Design.,Integrated circuits--Very large scale integration--Testing.,Systems on a chip--Testing
KW  - TECHNOLOGY & ENGINEERING
UR  - https://search.ebscohost.com/login.aspx?direct=true&db=e000xww&site=ehost-live&scope=site&AN=214796
ER  -