Patrizia Ciarlini-Eduarda Filipe-Alistair B Forbes-Franco Pavese-Christophe Perruchet-Bernd R L Siebert <br/><br/>
Advanced Mathematical And Computational Tools In Metrology Vii 

 -  World Scientific  2006 
 - Series on Advances in Mathematics for Applied Sciences .
<br/><br/><label>ISBN: </label>9789812566744 
<br/><br/><label>Subjects--Topical Terms: </label><br/> General<br/> Probability & Statistics <br/>MATHEMATICS <br/>Measurement--Congresses.,Physical measurements--Congresses.