Manuel Jesus Bellido Diaz-Jorge Juan Chico-Manuel Valencia <br/><br/>
Logic-timing Simulation And The Degradation Delay Model 

 -  Imperial College Press  2006 
<br/><br/><label>ISBN: </label>9781860945892 
<br/><br/><label>Subjects--Topical Terms: </label><br/> Electrical<br/>Integrated circuits--Very large scale integration.,Metal oxide semiconductors, Complementary.,Timing circuits.<br/>TECHNOLOGY & ENGINEERING