Fujiwara, Hideo <br/><br/>
Logic testing and design for testability 

 - London  MIT Press  1985 
 - x, 284p.  
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>262060965 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Circuits -- Logic circuits <br/>Electronic circuits -- Logic design<br/>Fault simulation -- Logic circuits<br/>Logic circuits -- Testing