TY  - BOOK
AU  - Bardell, Paul H
AU  - McAnney, William H
AU  - Savir, Jacob
TI  - Built-in test for VLSI pseudorandom techniques
SN  - 471624632
CY  - New York
KW  - Integrated circuits -- Very large scale integration(VLSI) -- Testing
N1  - Includes index
ER  -