Crouch, Alfred, L <br/><br/>
Design-for-test for digital IC'S and embedded core systems 

 - New Delhi  Pearson Education  1999 
 - xxviii, 349p.   
<br/><br/><label>ISBN: </label>8131717895 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Design-for-test (<br/>DFT)  Digital integrated circuits<br/>Digital design