Bushnell, Michael L <br/><br/>
Essentials of electronic testing for digital memory and mixed - signal VLSI circuits 

 - New York  Springer  2000 
 - xviii, 690p.   
<br/><br/><label>ISBN: </label>792379918 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital circuits  Testing<br/>Electronic circuits  Very large scale integration<br/>Integrated electronic circuits(VLSI)  Testing<br/>Memory (Logic circuits) --<br/>VLSI circuits  Testing