Abramovici, Miron, Ed. <br/><br/>
Digital systems testing and testable design 

 -  Jaico Publishing  Delhi 
 - xviii, 652p:  
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>8172248911 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Bridging faults  Testing<br/>Digital systems  Testing<br/>Fault modeling and simulation<br/>Logic-level diagnosis<br/>Single stuck faults  Testing<br/>Testable design -- Digital systems