Crouch, Alfred L <br/><br/>
Design-for-test for digital IC's and embedded core systems 

 -  New Delhi  Pearson Education  1999 
 - xxviii, 349p. : ill.   
<br/><br/> Reprint year 2009. Includes glossary and index. 
<br/><br/><label>ISBN: </label>9788131717899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Design-for-test DFT  Digital integrated circuits <br/>Digital integrated circuits<br/>HDL  digital circuits<br/>Logic circuits<br/>Logic gates