TY  - BOOK
AU  - Crouch, Alfred L
TI  - Design-for-test for digital IC's and embedded core systems
SN  - 9788131717899
PB  - New Delhi
KW  - Design-for-test DFT  Digital integrated circuits
KW  - Digital integrated circuits
KW  - HDL  digital circuits
KW  - Logic circuits
KW  - Logic gates
N1  - Reprint year 2009. Includes glossary and index
ER  -