Bushnell, Michael L <br/><br/>
Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits 

 -  New York  Springer  2000 
 - xviii, 690p.   
 - Frontiers in electronic testing .
<br/><br/> Includes bibliographical references and index 
<br/><br/><label>ISBN: </label>792379918 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital DFT and Scan design<br/>Digital integrated circuits  Testing<br/>Electronic testing  Digital integrated circuits<br/>Logic and Fault simulation<br/>Memory testing<br/>Testing  Electronic testing<br/>VLSI Integrated circuits  Testing