TY  - BOOK
AU  - Bushnell, Michael L
AU  - Agrawal, Vishwani D
TI  - Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits
T2  - Frontiers in electronic testing
SN  - 792379918
PB  - New York
KW  - Digital DFT and Scan design
KW  - Digital integrated circuits  Testing
KW  - Electronic testing  Digital integrated circuits
KW  - Logic and Fault simulation
KW  - Memory testing
KW  - Testing  Electronic testing
KW  - VLSI Integrated circuits  Testing
N1  - Includes bibliographical references and index
ER  -